Scanning Hall Probe Microscope
Lambert M. Surhone, Mariam T. Tennoe, Susan F. Henssonow
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Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor.
This combination allows to map the magnetic induction associated with a sample.
Current state of the art SHPM systems utilize 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution ( 300 nm) imaging with high magnetic field sensitivity.
Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material.
The SHPM can also image magnetic induction under applied fields up to 1 tesla and over a wide range of temperatures (millikelvins to 300 K).
